Backscattered electron (BSE) imaging is a technique used in electron microscopy to obtain high-resolution images of the surface and subsurface structure of a material. BSE imaging works by detecting electrons that have been scattered back from the sample surface and recording their energy and trajectory.
In a typical BSE imaging setup, a beam of electrons is directed onto the sample surface, and the electrons that penetrate the material are scattered by the atoms within the sample. Some of these scattered electrons are backscattered and have enough energy to escape the sample and reach the detector.
The energy of the backscattered electrons depends on the type of atoms they interact with and their depth within the sample. This information can be used to create an image of the sample’s surface and subsurface structure, with higher atomic number elements appearing brighter and lower atomic number elements appearing darker.
BSE imaging is a valuable tool in many fields, including materials science, geology, and biology, and it has applications in a variety of areas, such as surface analysis, imaging of buried structures, and imaging of trace elements in samples.
Overall, BSE imaging is a useful and powerful technique for imaging the surface and subsurface structure of materials and provides valuable information for many areas of research and investigation. learn more about Admission Management.
