Force microscopy is a powerful nanoscale imaging technique that measures the interaction forces between a sharp probe and a sample surface to create high-resolution images. One prominent example is Atomic Force Microscopy (AFM). In AFM, a tiny cantilever with a sharp tip is used to scan the surface of a specimen. As the tip moves, forces between the atoms on the tip and the atoms on the sample surface cause the cantilever to deflect. This deflection is precisely monitored, providing detailed information about the surface topography, mechanical properties, and even chemical forces at the nanoscale. Force microscopy has applications in various scientific fields, including materials science, biology, and surface characterization.